Prognostic and remaining useful life (RUL) predictions for electrolytic capacitors under thermal overstress condition are investigated in this paper. In the first step, the degradation process is modeled as a physics of failure process. All of the relevant parameters and states of the capacitor are considered during the degradation process. A particle filter approach is utilized to derive the dynamic form of the degradation model and estimate the current state of capacitor health. This model is then used to get more accurate estimation of the Remaining Useful Life (RUL) of the capacitors as they are subjected to the thermal stress conditions. The paper includes an experimental study, where the degradation of a set of identical capacitors under thermal overstress conditions is studied to demonstrate and validate the performance of the degradation modeling approach.
How to Cite
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