This article reports on preliminary results of a study conducted to examine how temporary electrical overstress seed fault conditions in discrete power electronic components that cannot be detected with reliability tests but impact longevity of the device. These defects do not result in formal parametric failures per datasheet specifications, but result in substantial change in the electrical characteristics when compared with pristine device parameters. Tests were carried out on commercially available 600V IGBT devices using transmission line pulse (TLP) and system level ESD stress. It was hypothesized that the ESD causes local damage during the ESD discharge which may greatly accelerate degradation mechanisms and thus reduce the life of the components. This hypothesis was explored in simulation studies where different types of damage were imposed to different parts of the device. Experimental results agree qualitatively with the simulation for a number of tests which will motivate more in-depth modeling of the damage.
How to Cite
avionics, field effect transistors (FET), semiconductor device reliability, test rig, applications: electronics
(Davidson, 2006) S. Davidson. Searching for clues: Diagnosing IC failures, IEEE design and Test of Computers, vol. 23, issue 1, pp. 67- 68.
(Desineni and Blanton, 2005). R. Desineni and R. D. Blanton. Diagnostics of arbitrary using neighborhood Function Extraction, in Proceedings of 23rd IEEE VLSI Test Symposium, 2005, pp. 366- 373.
(Khatir et al., 1994) Z. Khatir, J. Skipedj, and R. Lallemand. Main Technological causes and some mechanisms of high power GTO’s failures, in Proceedings of Fifth International Conference on Power Electronics and Variable-Speed Drives, pp. 319-324.
(Li and Huang,2009) T. S. Li and C. L. Huang. Defect spatial pattern recognition using a hybrid SOM- SVM approach in semiconductor manufacturing, Expert Systems with Applications: An International Journal, vol. 36, issue 1, pp. 374-385.
(Sonnenfeld et al., 2008) G. Sonnenfeld, K. Goebel, and J. R. Celaya. An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors, in Proceedings of AUTOTESTCON, 2008 IEEE, pp. 208-215.
(Toh, 2008) S. L. Toh. In-depth electrical analysis to reveal the failure mechanisms with nanoprobing, IEEE Transactions on Device and Materials Reliability, vol. 8, issue 2, pp. 387-393.
(Angstrom, 2009) DECIMM (DEvice-CIrcuit Mixed- Mode)Version 2.0, Installation GuideUser Reference Manual, Ångstrom Design Automation Inc., 2009.
This work is licensed under a Creative Commons Attribution 3.0 Unported License.
The Prognostic and Health Management Society advocates open-access to scientific data and uses a Creative Commons license for publishing and distributing any papers. A Creative Commons license does not relinquish the author’s copyright; rather it allows them to share some of their rights with any member of the public under certain conditions whilst enjoying full legal protection. By submitting an article to the International Conference of the Prognostics and Health Management Society, the authors agree to be bound by the associated terms and conditions including the following:
As the author, you retain the copyright to your Work. By submitting your Work, you are granting anybody the right to copy, distribute and transmit your Work and to adapt your Work with proper attribution under the terms of the Creative Commons Attribution 3.0 United States license. You assign rights to the Prognostics and Health Management Society to publish and disseminate your Work through electronic and print media if it is accepted for publication. A license note citing the Creative Commons Attribution 3.0 United States License as shown below needs to be placed in the footnote on the first page of the article.
First Author et al. This is an open-access article distributed under the terms of the Creative Commons Attribution 3.0 United States License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.