A Practical Hybrid Framework for RUL Prediction in Ion Mill Etching by Integrating Operational States

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Published Jan 13, 2026
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Abstract

Recent deep learning approaches for Remaining Useful Life (RUL) prediction in ion mill etching have achieved remarkable performance. State-of-the-art models, particularly those based on the Transformer architecture, have reached high prediction accuracy by exclusively training on data from the primary operational state. However, this strategy discards data from ancillary operational states, failing to address the critical challenge of providing the continuous RUL predictions required for practical applications.This research highlights the limitations of existing methods, which create "prediction gaps," and proposes a state-aware hybrid framework that considers the complete operational profile of the equipment. We apply a high-performance deep learning model for the primary operational state to ensure our predictive accuracy is competitive with state-of-the-art methods. The core contribution of our work, however, is the systematic design and validation of estimation logic for the previously ignored ancillary states. Specifically, we integrate the primary deep learning model with rule-based methods and simpler statistical models that activate during these ancillary states. This hybrid approach enables a shift from a competition based on accuracy under ideal conditions to the development of a robust and practical RUL prediction system. This paper argues for the importance of an integrated predictive framework that covers the full equipment lifecycle, rather than focusing on a single, complex model for a subset of data.

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Keywords

Remaining Useful Life Prediction, Prognostics and Health Management, Ion Mill Etching, State-Aware Prediction, Semiconductor Manufacturing

References
for predicting remaining useful life with machine learning. Electronics, 11(7), 1125.
Darwish, A. (2024). A data-driven deep learning approach for remaining useful life in the ion mill etching process. Sustainable machine intelligence journal, 8(2), 14-34.
Ferreira, C., & Gonçalves, G. (2022). Remaining Useful Life prediction and challenges: A literature review on the use of Machine Learning Methods. Journal of Manufacturing Systems, 63(May), 550-562.
Hsu, C. Y., Lu, Y. W., & Yan, J. H. (2022). Temporal convolution-based long-short term memory network with attention mechanism for remaining useful life prediction. IEEE Transactions on Semiconductor Manufacturing, 35(2), 220-228.
Liu, C., Zhang, L., Li, J., Zheng, J., & Wu, C. (2021). Two-stage transfer learning for fault prognosis of ion mill etching process. IEEE Transactions on Semiconductor Manufacturing, 34(2), 185-193.
Liu, Y., Wen, J., & Wang, G. (2025). A comprehensive overview of remaining useful life prediction: From traditional literature review to scientometric analysis. Machine Learning with Applications, 100704.
Xue, B., Xu, H., Huang, X., Zhu, K., Xu, Z., & Pei, H. (2022). Similarity-based prediction method for machinery remaining useful life: A review. The international journal of advanced manufacturing technology, 121(3), 1501-1531.
Yuan, Z., & Wang, R. (2023, August). A Squeeze-and-Excitation and Transformer Based Model for Remaining Useful Life Prediction in Ion Mill Etching Process. In 2023 IEEE 19th International Conference on Automation Science and Engineering (CASE) (pp. 1-6). IEEE.
Yuan, Z., & Wang, R. (2024). Multi-scale and multi-branch transformer network for remaining useful life prediction in ion mill etching process. IEEE Transactions on Semiconductor Manufacturing, 37(1), 67-75.
Wang, T., Yu, J., Siegel, D., & Lee, J. (2008, October). A similarity-based prognostics approach for remaining useful life estimation of engineered systems. In 2008 international conference on prognostics and health management (pp. 1-6). IEEE.
Wang, T. (2010). Trajectory similarity-based prediction for remaining useful life estimation. University of Cincinnati
Wu, F., Wu, Q., Tan, Y., & Xu, X. (2024). Remaining useful life prediction based on deep learning: a survey. Sensors, 24(11), 3454.
Wu, S., Jiang, Y., Luo, H., & Yin, S. (2021). Remaining useful life prediction for ion etching machine cooling system using deep recurrent neural network-based approaches. Control Engineering Practice, 109, 104748.
Section
Regular Session Papers