Physics Based Degradation Models for Electrolytic Capacitor Prognostics under Thermal Overstress Conditions
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Published
Oct 23, 2020
Chetan S. Kulkarni
Gautam Biswas
José R. Celaya
Kai Goebel
Abstract
Electronics subsystems play an increasingly important role in safety critical systems for monitoring, control, and enhanced functionality. Electrolytic capacitors are an important component in ,amy subsystems that range from power supplies on safety critical avionics equipment to power drivers for electro-mechanical actuators. These capacitors are ideal for
passing or bypassing low-frequency signals in power supplies but are known to have lower reliability compared to ceramic and tantalum capacitors, and given their criticality in electronics
subsystems they are a good candidate for component level monitoring and prognostics. Prognostics provides a way to assess remaining useful life of components and systems based on their current state of health and their anticipated future use and operating conditions. Past experiences have shown that capacitor degradation and failures are quite prevalent under high electrical and thermal stress conditions that they experience during operations. Our focus in this work is on deriving a physics-based degradation model for electrolytic capacitors under thermal stress conditions. As part of our methodology, we study the effects of accelerated aging due to thermal stress on a batch of capacitors stored at high ambient temperature conditions. This provides a framework for supplementing theoretical modeling with data collected from simultaneous experiments, which is then used to validate the derived models. This work represents a first step toward combining data driven and physics-based approaches for modeling capacitor degradation. The case study shows how the proposed technique is applied to a batch of identically manufactured capacitors.
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Keywords
electronics PHM, Capacitors, Physics-based degradation models, Capacitance, Accelerated aging, Thermal Overstress
References
Albella, J. M., Gomez-Aleixandre, C., & Martinez-Duart, J. M. (1984). Dielectric characteristics of miniature aluminium electrolytic capacitors under stressed voltage conditions. Journal of Applied Electrochemistry, Volume 14, Number 1, 9 - 14.
Alwitt, R. S., & Parler, S. G. (1995). Heat generation during pulse operation of prototype aluminum electrolytic capacitors. Journal of Applied Electrochemistry, Volume 25, Number 6, 533 - 542.
Balaban, E., Saxena, A., Narasimhan, S., Roychoudhury, I., Goebel, K., & Koopmans, M. (2010). Airborne electro-mechanical actuator test stand for development of prognostic health management systems. Proceedings of Annual Conference of the PHM Society 2010, October 10-16, Portland, OR.
Bengt, A. (1995). Electrolytic capacitors theory and applications. RIFA Electrolytic Capacitors.
Biologic. (2010). Application note 14-zfit and equivalent electrical circuits [Computer software manual].
Brettle, J., & Jackson, N. F. (1977). Failure mechanisms in solid electrolytic capacitors. Electrocomponent Science and Technology, 3, 233 - 246.
Buiatti, G., Martin-Ramos, J., Garcia, C., Amaral, A., & Cardoso, A. (2010). An online and noninvasive technique for the condition monitoring of capacitors in boost converters. IEEE Transactions on Instrumentation and Measurement, 59, 2134 - 2143.
Campbell, D. S. (1971, January). Electrolytic capacitors. The Radio and Electronic Engineer, 41(1), 5 - 16.
Celaya, J., Kulkarni, C., Biswas, G., & Goebel, K. (2011). A model-based prognostics methodology for electrolytic capacitors based on electrical overstress accelerated aging. Proceedings of Annual Conference of the PHM Society, September 25-29, Montreal, Canada.
Celaya, J., Saxena, A., Wysocki, P., Saha, S., & Goebel, K. (2010). Towards prognostics of power mosfets: Accelerated aging and precursors of failure. Proceedings of Annual Conference of the PHM Society, October 10-16, Portland, OR.
Celaya, J., Wysocki, P., Vashchenko, V., Saha, S., & Goebel, K. (2010, September). Accelerated aging system for prognostics of power semiconductor devices. Proceedings of IEEE Autotestcon, 1-6.
Chen. (2004). Ripple current confusion [Computer software manual].
Daigle, M., & Goebel, K. (2011). A model-based prognostics approach applied to pneumatic valves. International Journal of the PHM Society, Vol. 2(8), 1-16.
Ferrell, B. L. (1999). JSF prognostics and health management. IEEE Aerospace Conference.
FIDESGroup. (2004). Reliability methodology for electronic systems. FIDES Guide issue A.
Fife, J. (2006, August). Wet electrolytic capacitors (Patent No: 7,099 No. 1). Myrtle Beach, SC: AVX Corporation.
Gasperi, M. L. (1996, October). Life prediction model for aluminum electrolytic capacitors. 31st Annual Meeting of the IEEE-IAS, 4(1), 1347 - 1351.
Gomez-Aleixandre, C., Albella, J. M., & Martinez-Duart, J. M. (1984). Gas evolution in aluminum electrolytic capacitors. Journal of Electrochem. Society, Volume 131, Issue 3, 612 - 614.
Goodman, D., Hofmeister, J., & Judkins, J. (2007). Electronic prognostics for switched mode power supplies. Microelectronics Reliability, 47(12), 1902 - 1906.
Gu, J., Azarian, M. H., & Pecht, M. G. (2008). Failure prognostics of multilayer ceramic capacitors in temperature-humidity-bias conditions. International Conference on Prognostics and Health Management.
Gu, J., & Pecht, M. (2008). Prognostics and health management using physics-of-failure. 54th Annual Reliability and Maintainability Symposium (RAMS).
Hansen, P., & McCluskey, P. (2007). Failure models in power device interconnects. European Conference on Power Electronics and Applications, 1 - 9.
IEC-60068-1. (1988). Environmental testing, part 1: General and guidance. IEC Standards.
Ikonopisov, S. (1977). Theory of electrical breakdown during formation of barrier anodic films. Electrochimica Acta, ,Volume 22, Issue 10, 1077 - 1082.
Imam, A. M. (2007). Condition monitoring of electrolytic capacitors for power electronics applications. Unpublished doctoral dissertation, Georgia Institute of Technology.
Judkins, J. B., Hofmeister, J., & Vohnout, S. (2007). A prognostic sensor for voltage regulated switch-mode power supplies. IEEE Aerospace Conference, 1, 1 - 8.
Kulkarni, C., Biswas, G., & Koutsoukos, X. (2009). A prognosis case study for electrolytic capacitor degradation in dc-dc converters. Proceedings of Annual Conference of the PHM Society, San Diego, CA.
Kulkarni, C., Biswas, G., Koutsoukos, X., Goebel, K., & Celaya, J. (2010, September). Diagnostic/prognostic experiments for capacitor degradation and health monitoring in dc-dc converters. SMASIS 2010.
Kulkarni, C., Celaya, J., Biswas, G., & Goebel, K. (2011). Prognostic modeling and experimental techniques for electrolytic capacitor health monitoring. The 8th International Workshop on Structural Health Monitoring 2011 (IWSHM) , September 13-15, Stanford University, Stanford, CA.
Kulkarni, C., Celaya, J., Goebel, K., & Biswas, G. (2012, July). Physics based electrolytic capacitor degradation models for prognostic studies under thermal overstress. Proceedings of First European Conference of the Prognostics and Health Management Society.
Leonard, C., & Pecht, M. G. (1991). Improved techniques for cost effective electronics. Proceedings of Reliability Maintainability Symposium, 174 - 182.
Luo, J., Namburu, M., Pattipati, K., & et’al. (2003, Sep). Model-based prognostic techniques. AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings, 330 - 340.
Morley, A. R., & Campbell, D. S. (1973, July). Electrolytic capacitors: Their fabrication and the interpretation of their operational behaviour. The Radio and Electronic Engineer, 43(7), 421 - 429.
Nasser, L., & Curtin, M. (2006, March). Electronics reliability prognosis through material modeling and simulation. Proceedings of IEEE Aerospace Conference.
Nie, L., Azarian, M., Keimasi, M., & Pecht, M. (2007). Prognostics of ceramic capacitor temperature humidity bias reliability using mahalanobis distance. Circuit World, 33(3), 21 - 28.
Orsagh, R., & et’al. (2006, March). Prognostic health management for avionics system power supplies. Aerospace Conference, 2006 IEEE, 1 - 7.
Pecht, M., Dube, M., Natishan, M., & Knowles, I. (2001). An evaluation of built-in test. IEEE Transactions on Aerospace and Electronic Systems, 37, 266 - 272.
Rodner, S. C., Wedin, P., & Bergstram, L. (2002). Effect of electrolyte and evaporation rate on the structural features of dried silica monolayer films. Langmuir, 18(24), 9327 - 9333.
Roederstein, V. (2007). Aluminum capacitors - general information. Document - 25001 January 2007.
Rusdi, M., Moroi, Y., Nakahara, H., & Shibata, O. (2005). Evaporation from water ethylene glycol liquid mixture. Langmuir - American Chemical Society, 21 (16), 7308- 7310.
Saha, B., & Goebel, K. (2011). Model adaptation for prognostics in a particle filtering framework. International Journal of the PHM Society, Vol. 2(6), 1-12.
Tasca, D. M. (1981). Pulse power response and damage characterization of capacitors. Electrical Overstress-Electrostatic Discharge Symposium Proceedings, EOS/ESD Association, 3.
Upadhyayula, K., & Dasgupta, A. (1998). Guidelines for physics-of-failure based accelerated stress testing. Annual Reliability and Maintainability Symposium, 345 -357.
Vichare, N., & Pecht, M. (2006). Prognostics and health management of electronics. IEEE Transactions on Components and Packaging Technologies, Vol 29, 222 - 229.
Vohnout, S., Kozak, M., Goodman, D., Harris, K., & Judkins, J. (2008). Electronic prognostics system implementation on power actuator components. Aerospace Conference, 2008 IEEE, 1 - 11.
Watson, G. F. (1992). Mil reliabiliy: A new approach. IEEE Spectrum, August 1992, 46 - 49.
Wereszczak, A., Breder, K., & Ferber, M. K. (1998). Failure probability prediction of dielectric ceramics in multilayer capacitors. Annual Meeting of the American Ceramic Society, Cincinnati, OH (United States).
Wit, H. D., & Crevecoeur, C. (1974). The dielectric breakdown of anodic aluminum oxide. Physics Letters A, Volume 50, Issue 5, 365 - 366.
Alwitt, R. S., & Parler, S. G. (1995). Heat generation during pulse operation of prototype aluminum electrolytic capacitors. Journal of Applied Electrochemistry, Volume 25, Number 6, 533 - 542.
Balaban, E., Saxena, A., Narasimhan, S., Roychoudhury, I., Goebel, K., & Koopmans, M. (2010). Airborne electro-mechanical actuator test stand for development of prognostic health management systems. Proceedings of Annual Conference of the PHM Society 2010, October 10-16, Portland, OR.
Bengt, A. (1995). Electrolytic capacitors theory and applications. RIFA Electrolytic Capacitors.
Biologic. (2010). Application note 14-zfit and equivalent electrical circuits [Computer software manual].
Brettle, J., & Jackson, N. F. (1977). Failure mechanisms in solid electrolytic capacitors. Electrocomponent Science and Technology, 3, 233 - 246.
Buiatti, G., Martin-Ramos, J., Garcia, C., Amaral, A., & Cardoso, A. (2010). An online and noninvasive technique for the condition monitoring of capacitors in boost converters. IEEE Transactions on Instrumentation and Measurement, 59, 2134 - 2143.
Campbell, D. S. (1971, January). Electrolytic capacitors. The Radio and Electronic Engineer, 41(1), 5 - 16.
Celaya, J., Kulkarni, C., Biswas, G., & Goebel, K. (2011). A model-based prognostics methodology for electrolytic capacitors based on electrical overstress accelerated aging. Proceedings of Annual Conference of the PHM Society, September 25-29, Montreal, Canada.
Celaya, J., Saxena, A., Wysocki, P., Saha, S., & Goebel, K. (2010). Towards prognostics of power mosfets: Accelerated aging and precursors of failure. Proceedings of Annual Conference of the PHM Society, October 10-16, Portland, OR.
Celaya, J., Wysocki, P., Vashchenko, V., Saha, S., & Goebel, K. (2010, September). Accelerated aging system for prognostics of power semiconductor devices. Proceedings of IEEE Autotestcon, 1-6.
Chen. (2004). Ripple current confusion [Computer software manual].
Daigle, M., & Goebel, K. (2011). A model-based prognostics approach applied to pneumatic valves. International Journal of the PHM Society, Vol. 2(8), 1-16.
Ferrell, B. L. (1999). JSF prognostics and health management. IEEE Aerospace Conference.
FIDESGroup. (2004). Reliability methodology for electronic systems. FIDES Guide issue A.
Fife, J. (2006, August). Wet electrolytic capacitors (Patent No: 7,099 No. 1). Myrtle Beach, SC: AVX Corporation.
Gasperi, M. L. (1996, October). Life prediction model for aluminum electrolytic capacitors. 31st Annual Meeting of the IEEE-IAS, 4(1), 1347 - 1351.
Gomez-Aleixandre, C., Albella, J. M., & Martinez-Duart, J. M. (1984). Gas evolution in aluminum electrolytic capacitors. Journal of Electrochem. Society, Volume 131, Issue 3, 612 - 614.
Goodman, D., Hofmeister, J., & Judkins, J. (2007). Electronic prognostics for switched mode power supplies. Microelectronics Reliability, 47(12), 1902 - 1906.
Gu, J., Azarian, M. H., & Pecht, M. G. (2008). Failure prognostics of multilayer ceramic capacitors in temperature-humidity-bias conditions. International Conference on Prognostics and Health Management.
Gu, J., & Pecht, M. (2008). Prognostics and health management using physics-of-failure. 54th Annual Reliability and Maintainability Symposium (RAMS).
Hansen, P., & McCluskey, P. (2007). Failure models in power device interconnects. European Conference on Power Electronics and Applications, 1 - 9.
IEC-60068-1. (1988). Environmental testing, part 1: General and guidance. IEC Standards.
Ikonopisov, S. (1977). Theory of electrical breakdown during formation of barrier anodic films. Electrochimica Acta, ,Volume 22, Issue 10, 1077 - 1082.
Imam, A. M. (2007). Condition monitoring of electrolytic capacitors for power electronics applications. Unpublished doctoral dissertation, Georgia Institute of Technology.
Judkins, J. B., Hofmeister, J., & Vohnout, S. (2007). A prognostic sensor for voltage regulated switch-mode power supplies. IEEE Aerospace Conference, 1, 1 - 8.
Kulkarni, C., Biswas, G., & Koutsoukos, X. (2009). A prognosis case study for electrolytic capacitor degradation in dc-dc converters. Proceedings of Annual Conference of the PHM Society, San Diego, CA.
Kulkarni, C., Biswas, G., Koutsoukos, X., Goebel, K., & Celaya, J. (2010, September). Diagnostic/prognostic experiments for capacitor degradation and health monitoring in dc-dc converters. SMASIS 2010.
Kulkarni, C., Celaya, J., Biswas, G., & Goebel, K. (2011). Prognostic modeling and experimental techniques for electrolytic capacitor health monitoring. The 8th International Workshop on Structural Health Monitoring 2011 (IWSHM) , September 13-15, Stanford University, Stanford, CA.
Kulkarni, C., Celaya, J., Goebel, K., & Biswas, G. (2012, July). Physics based electrolytic capacitor degradation models for prognostic studies under thermal overstress. Proceedings of First European Conference of the Prognostics and Health Management Society.
Leonard, C., & Pecht, M. G. (1991). Improved techniques for cost effective electronics. Proceedings of Reliability Maintainability Symposium, 174 - 182.
Luo, J., Namburu, M., Pattipati, K., & et’al. (2003, Sep). Model-based prognostic techniques. AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings, 330 - 340.
Morley, A. R., & Campbell, D. S. (1973, July). Electrolytic capacitors: Their fabrication and the interpretation of their operational behaviour. The Radio and Electronic Engineer, 43(7), 421 - 429.
Nasser, L., & Curtin, M. (2006, March). Electronics reliability prognosis through material modeling and simulation. Proceedings of IEEE Aerospace Conference.
Nie, L., Azarian, M., Keimasi, M., & Pecht, M. (2007). Prognostics of ceramic capacitor temperature humidity bias reliability using mahalanobis distance. Circuit World, 33(3), 21 - 28.
Orsagh, R., & et’al. (2006, March). Prognostic health management for avionics system power supplies. Aerospace Conference, 2006 IEEE, 1 - 7.
Pecht, M., Dube, M., Natishan, M., & Knowles, I. (2001). An evaluation of built-in test. IEEE Transactions on Aerospace and Electronic Systems, 37, 266 - 272.
Rodner, S. C., Wedin, P., & Bergstram, L. (2002). Effect of electrolyte and evaporation rate on the structural features of dried silica monolayer films. Langmuir, 18(24), 9327 - 9333.
Roederstein, V. (2007). Aluminum capacitors - general information. Document - 25001 January 2007.
Rusdi, M., Moroi, Y., Nakahara, H., & Shibata, O. (2005). Evaporation from water ethylene glycol liquid mixture. Langmuir - American Chemical Society, 21 (16), 7308- 7310.
Saha, B., & Goebel, K. (2011). Model adaptation for prognostics in a particle filtering framework. International Journal of the PHM Society, Vol. 2(6), 1-12.
Tasca, D. M. (1981). Pulse power response and damage characterization of capacitors. Electrical Overstress-Electrostatic Discharge Symposium Proceedings, EOS/ESD Association, 3.
Upadhyayula, K., & Dasgupta, A. (1998). Guidelines for physics-of-failure based accelerated stress testing. Annual Reliability and Maintainability Symposium, 345 -357.
Vichare, N., & Pecht, M. (2006). Prognostics and health management of electronics. IEEE Transactions on Components and Packaging Technologies, Vol 29, 222 - 229.
Vohnout, S., Kozak, M., Goodman, D., Harris, K., & Judkins, J. (2008). Electronic prognostics system implementation on power actuator components. Aerospace Conference, 2008 IEEE, 1 - 11.
Watson, G. F. (1992). Mil reliabiliy: A new approach. IEEE Spectrum, August 1992, 46 - 49.
Wereszczak, A., Breder, K., & Ferber, M. K. (1998). Failure probability prediction of dielectric ceramics in multilayer capacitors. Annual Meeting of the American Ceramic Society, Cincinnati, OH (United States).
Wit, H. D., & Crevecoeur, C. (1974). The dielectric breakdown of anodic aluminum oxide. Physics Letters A, Volume 50, Issue 5, 365 - 366.
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