A New Application for Failure Prognostics – Reduction of Automotive Electronics Reliability Test Duration



Andre Kleyner Arvind Vasan Michael Pecht


This paper presents a novel application of failure prognosis to shorten the time of reliability testing. Typically, prognostic outcome is used to make real time health management decisions such as modify mission plan, change system operation parameters to reduce stress and increase remaining useful life, and more. In this work we demonstrate the use of prognostics to reduce the duration of lengthy and expensive tests, such as power temperature
cycling and high temperature endurance in the automotive electronics validation process.

How to Cite

Kleyner, A., Vasan, A., & Pecht, M. (2017). A New Application for Failure Prognostics – Reduction of Automotive Electronics Reliability Test Duration. Annual Conference of the PHM Society, 9(1). https://doi.org/10.36001/phmconf.2017.v9i1.2446
Abstract 11 | PDF Downloads 14



prognostics, reliability, remaining useful life (RUL), applications: automotive, Validation and Verification, Temperature Cycling

Braden, D. and Harvey, D. (2014) “A Prognostic and Data Fusion Based Approach to Validation Automotive Electronics” SAE International, Technical Paper #2014-01-0724, doi: 10.427/2014-01-0724
Braden, D. and Harvey, D. (2014) “Aligning Component and System Qualification Testing through Prognostics”. Proceedings of ESTC pp: 1-6, doi:
Cheng, S. and Pecht, M. “Using cross-validation for model parameter selection of sequential probability ratio test,” Expert Systems with Applications, vol. 39, pp. 8467-8473, 2012.
GMW 3172 (2004) General Specification for Electrical/Electronic Component Analytical/Development/Validation (A/D/V). 2004. Procedures for Conformance to Vehicle. http://global.ihs.com/doc_detail.cfm?document_nameD GMW3172 (accessed November 10, 2014).
Kleyner, A. and Nebeling, A. (2016) Applying Automotive Robustness Validation to Reduce the Number of Unplanned Reliability Testing Cycles. Annual
Reliability and Maintainability Symposium (RAMS). IEEE Conference Publications, pp.1 - 7, DOI:10.1109/RAMS.2016.7448049
O’Connor, P. and Kleyner, A. (2012) Practical Reliability Engineering Edition 5. John Wiley and Sons, Chichester, UK.
Pecht, M. (2008) “Prognostics and Health Management of Electronics”, John Wiley &Sons, Inc. Hoboken, USA.
Pecht, M. and Gu, J. (2009) Prognostics-Based Product Qualification. Proceedings of Aerospace Conference, 2009 IEEE, DOI: 10.1109/AERO.2009.4839686
Pecht, M., George, E., Vasan, A. (2014) Fusion Prognosticsbased Qualification of Microelectronic Devices. IEEE 21st International Symposium on the Physical and Failure Analysis if Integrated Circuits (IPFA), pp: 383 - 389, DOI: 10.1109/IPFA.2014.6898209
Vasan, A., Long, B. and Pecht, M. (2013) “Diagnostics and prognostics method for analog electronic circuits,” IEEE Transactions on Industrial Electronics, vol. 60, no. 11, pp. 5277-5291, 2013.
Technical Papers