Effects of Lightning Injection on Power-MOSFETs



Published Mar 26, 2021
Jose Celaya Sankalita Saha Phil Wysocki Jay Ely Truong Nguyen George Szatkowski Sandra Koppen John Mielnik Roger Vaughan Kai Goebel

How to Cite

Celaya, J., Saha, S., Wysocki, P., Ely, J., Nguyen, T., Szatkowski, G., Koppen, S., Mielnik, J., Vaughan, R., & Goebel, K. (2021). Effects of Lightning Injection on Power-MOSFETs. Annual Conference of the PHM Society, 1(1). Retrieved from https://papers.phmsociety.org/index.php/phmconf/article/view/1507
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electronics PHM, field effect transistors (FET), materials degradation, semiconductor device reliability, applications: electronics

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