Development of a Mechanical Characterization Technique for Microand Nanoscale Polymer Thin-films

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Published Jul 14, 2017
Yun Young Kim

Abstract

A measurement technique for the mechanical characterization of micro- and nanoscale polymer thin-films was introduced in the present study. An experimental setup was established using an ultrasonic pulser that actuates a microcantilever so that material properties such as the Young’s modulus and shear modulus can be determined by detecting the resonant frequency shift upon coating of a thin-film to be evaluated using a laser interferometer. The present research proposes an evaluation method for the robust design of organic electronics and energy devices.

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Keywords

PHM

References
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Section
Special Session Papers