What are the effects of the reliability model uncertainties in the maintenance decisions?
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Published
Jul 14, 2017
Bruno Castanier
Fabrice Guérin
Laurent Saintis
Abstract
Most of the works proposed for the design of reliability test plans are devoted to the guaranty of the reliability performance of a product but scarce of them tackles maintenance issues. On the other hand, classical maintenance optimization criteria rarely take into account the variability of the failure parameters due to lack of data, especially when the data collection in the operating phase is expensive. The objective of this paper is to highlight through a numerical experiment the impact of the test plan design defined here by the number of the products to be tested and the test duration on the performance of a classical condition-based maintenance (CBM) policy.
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Keywords
PHM
References
Elsayed, E. A. (2013). Design of Reliability Test Plans: An Overview In Dohi T., & Nakagawa T. (Eds.), Stochastic Reliability and Maintenance Modeling (p. 41-62). Springer.
Santini, T., Morand, S., Fouladirad, M., Phung, L.V., Miller, F., Foucher, B., Grall, A. & Allard, B. (2014). Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. Microelectronics Reliability, 54 (9-10), 1718-1723
Hamada, M., (2006). Maintenance oriented optimal design of accelerated degradation testing. Doctoral dissertation. Wichita State University, USA.
Cheng, T.., Pandey, M.D. & van der Weide J.A.M. (2014) Value at Risk Associated with Maintenance of a Repairable System. In: Lee J., Ni J., Sarangapani J., Mathew J. (Eds.) Engineering Asset Management 2011. Lecture Notes in Mechanical Engineering. (p. 129- 138). Springer, London
Santini, T., Morand, S., Fouladirad, M., Phung, L.V., Miller, F., Foucher, B., Grall, A. & Allard, B. (2014). Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. Microelectronics Reliability, 54 (9-10), 1718-1723
Hamada, M., (2006). Maintenance oriented optimal design of accelerated degradation testing. Doctoral dissertation. Wichita State University, USA.
Cheng, T.., Pandey, M.D. & van der Weide J.A.M. (2014) Value at Risk Associated with Maintenance of a Repairable System. In: Lee J., Ni J., Sarangapani J., Mathew J. (Eds.) Engineering Asset Management 2011. Lecture Notes in Mechanical Engineering. (p. 129- 138). Springer, London
Section
Invited Papers