Effects of Lightning Injection on Power-MOSFETs
##plugins.themes.bootstrap3.article.main##
##plugins.themes.bootstrap3.article.sidebar##
How to Cite
##plugins.themes.bootstrap3.article.details##
electronics PHM, field effect transistors (FET), materials degradation, semiconductor device reliability, applications: electronics
(Saha et al. 2009) B. Saha, J. Celaya, K. Goebel and P. Wysocki. Towards Prognostics for Electronics Components, in Proceedings of IEEE AEROSPACE, 2009.
(Satoh 2007) H. Satoh. Transient temperature response of avalanche diodes against lightning surges, Electronics and Communications in Japan (Part II: Electronics), vol. 72:(10), pp. 33-39, 2007.
(Satoh and Shimoda 1996) H. Satoh and Y. Shimoda. Two-dimensional analysis of surge response in thyristor lightning surge protection devices, in Proceedings of 8th International Symposium on Power Semiconductor Devices and ICs, 1996.
(Sonnenfeld et al. 2008) G. Sonnenfeld, K. Goebel and J. R. Celaya. An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors, in Proceedings of IEEE AUTOTESTCON, 2008.
(Tasca 1970) D. M. Tasca. Pulse Power Failure Modes in Semiconductors, IEEE Transactions on Nuclear Science, vol. 17:(6), 1970.
(Tasca 1976) D. M. Tasca. Pulse Power Damage Characteristics of Electrical Resistors, Air Force Weapons Laboratory, 1976.
(Wunsch and Bell 1968) D. C. Wunsch and R. R. Bell. Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse Voltages, IEEE Transactions on Nuclear Science, vol. 15:(6), pp. 244-259, 1968.
(Ely et. al. 2009) J. J. Ely, T. X. Nguyen, G. N. Szatkowski, S. V. Koppen, J. J. Mielnik, R. K. Vaughan, P. F. Wysocki, J. R. Celaya and S. Saha. Lightning Pin Injection Testing on MOSFETS, NASA, TM-2009-215794, 2009.
(Jenkins and Durgin 1975) C. R. Jenkins and D. L. Durgin. EMP Susceptibility of Integrated Circuits, in Proceedings of IEEE Conference on Nuclear and Space Radiation Effects, 1975.
(Jeong 2005) J.-S. Jeong. Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System, Journal of Microelectronics Reliability, vol. 45, pp. 1398- 1401, 2005.
(Keefe and Perala 1999) R. L. Keefe and R. A. Perala. Lightning Protection for Modern Signal Systems, in Proceedings of AREMA Annual Conference, 1999.
(Lall et al. 2008) P. Lall, C. Bhat, M. Hande, V. More, R. Vaidya, J. Suhling, R. Pandher and K. Goebel. Latent Damage Assessent and Prognostication of Residual Life in Airborne Lead-Free Electronics Under Thermo- Mechanical Loads, in Proceedings of International Conference on Prognostics and Health Management, 2008.
(Plumer 2009) J. A. Plumer. System Functional Upset testing of Aircraft Electrical and Avionic Systems: How to Approach the Planning and Conduct of the Tests, Lightning Technologies, Inc., http://www.lightningtech.com/pdfs/icolse.pdf, last access on September 2009.
(RTCA/DO-160E 2004) RTCA/DO-160E. Environmental Conditions and Test Procedures for Airborne Equipment, Section 22 “Lightning Induced Transient Susceptibility”, RTCA, DO-160E, 2004.
(SAE 2005) SAE. Aircraft Lightning Environment and Related Test Waveforms, SAE, ARP5412, 2005.
This work is licensed under a Creative Commons Attribution 3.0 Unported License.
The Prognostic and Health Management Society advocates open-access to scientific data and uses a Creative Commons license for publishing and distributing any papers. A Creative Commons license does not relinquish the author’s copyright; rather it allows them to share some of their rights with any member of the public under certain conditions whilst enjoying full legal protection. By submitting an article to the International Conference of the Prognostics and Health Management Society, the authors agree to be bound by the associated terms and conditions including the following:
As the author, you retain the copyright to your Work. By submitting your Work, you are granting anybody the right to copy, distribute and transmit your Work and to adapt your Work with proper attribution under the terms of the Creative Commons Attribution 3.0 United States license. You assign rights to the Prognostics and Health Management Society to publish and disseminate your Work through electronic and print media if it is accepted for publication. A license note citing the Creative Commons Attribution 3.0 United States License as shown below needs to be placed in the footnote on the first page of the article.
First Author et al. This is an open-access article distributed under the terms of the Creative Commons Attribution 3.0 United States License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.