Online Prediction of Remaining Lifetime of IGBT semiconductor Modules

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Published Jul 6, 2018
OULD MAHAMMED Salah

Abstract

This study presents online prediction of remaining useful lifetime of IGBT semiconductor modules using Prognostic and Health Management (PHM) algorithms. This research focuses on the analysis, modeling and exploitation of the degradation in wire-bonded power modules in order to estimate the remaining useful lifetime (RUL) of IGBTpower module.

How to Cite

Salah, O. M. (2018). Online Prediction of Remaining Lifetime of IGBT semiconductor Modules. PHM Society European Conference, 4(1). https://doi.org/10.36001/phme.2018.v4i1.429
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Keywords

Remaining useful lifetime, IGBT semiconductor module, degradation, probabilistic model

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