Electrolytic capacitors are used in several applications ranging from power supplies on safety critical avionics equipment to power drivers for electro-mechanical actuators. This makes them good candidates for prognostics and health management research. Prognostics provides a way to assess remaining useful life of components or systems based on their current state of health and their anticipated future use and operational conditions. Past experiences show that capacitors tend to degrade and fail faster under high electrical and thermal stress conditions that they are often subjected to during operations. In this work, we study the effects of accelerated aging due to thermal stress on different sets of capacitors under different conditions. Our focus is on deriving first principles degradation models for thermal stress conditions. Data collected from simultaneous experiments are used to validate the desired models. Our overall goal is to derive accurate models of capacitor degradation, and use them to predict performance changes in DC-DC converters.
How to Cite
accelerated failure time model, electronics PHM, Capacitors, Physics based models, Capacitance, Accelerated aging
60384-4-1, I. (2007). Fixed capacitors for use in electronic equipment. IEC Standards.
Balaban, E., Saxena, A., Narasimhan, S., Roychoudhury, I., Goebel, K., & Koopmans, M. (2010). Airborne Electro-Mechanical Actuator Test Stand for Development of Prognostic Health Management Systems. Proceedings of Annual Conference of the PHM Society 2010, October 10-16, Portland, OR.
Bengt, A. (1995). Electrolytic Capacitors Theory and Applications. RIFA Electrolytic Capacitors.
Bharadwaj, R., Kulkarni, C., Biswas, G., & Kim, K. (2010, April). Model-Based Avionics Systems Fault Simulation and Detection. American Institute of Aeronautics and Astronautics, AIAA Infotech@Aerospace 2010, AIAA-2010-3328.
Biologic. (2010). Application note 14-Zfit and equivalent electrical circuits [Computer software manual].
Buiatti, G., Martin-Ramos, J., Garcia, C., Amaral, A., & Cardoso, A. (2010). An Online and Noninvasive Technique for the Condition Monitoring of Capacitors in Boost Converters. IEEE Transactions on Instrumentation and Measurement, 59, 2134 - 2143.
Celaya, J., Kulkarni, C., Biswas, G., & Goebel, K. (2011a). A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging. Proceedings of Annual Conference of the PHM Society, September 25-29, Montreal, Canada.
Celaya, J., Kulkarni, C., Biswas, G., & Goebel, K. (2011b). Towards Prognostic of Electrolytic Capacitors. American Institute of Aeronautics and Astronautics, AIAA Infotech@Aerospace 2011, March 2011, St. Louis, Missouri.
Celaya, J. R., Wysocki, P., Vashchenko, V., Saha, S., & Goebel, K. (2010). Accelerated aging system for prognostics of power semiconductor devices. In IEEE AUTOTESTCON, 2010 (p. 1-6). Orlando, FL.
Eliasson, L. (2007, October - November). Aluminium Electrolytic Capacitor’s performance in Very High Ripple Current and Temperature Applications. CARTS Europe 2007 Symposium, Spain.
Fife, J. (2006, Aug). Wet Electrolytic Capacitors (Patent No: 7,099 No. 1). Myrtle Beach, SC: AVX Corporation.
Gasperi, M. L. (1996, October). Life Prediction Model for Aluminum Electrolytic Capacitors. 31st Annual Meeting of the IEEE-IAS, 4(1), 1347-1351.
Goebel, K., Saha, B., & Saxena, A. (2008). A Comparision of Three Data-Driven Tes for Prognostics. 62nd Meeting of the Society For Machinery Failure Prevention Technology (MFPT) Virginia Beach, VA, 119 - 131.
Gomez-Aleixandre, C., Albella, J. M., & Martnez-duart, J. M. (1986). Pressure build-up in aluminum electrolytic capacitors under stressed voltage conditions. Journal of Applied Electrochemistry, Volume 16, Number 1, 109 - 115.
Goodman, D., Hofmeister, J., & Judkins, J. (2007). Electronic prognostics for switched mode power supplies. Microelectronics Reliability, 47(12), 1902-1906.
Gu, J., Azarian, M. H., & Pecht, M. G. (2008). Failure Prognostics of Multilayer Ceramic Capacitors in Temperature-Humidity-Bias Conditions. International Conference on Prognostics and Health Management.
Gu, J., & Pecht, M. (2008). Prognostics and Health Management Using Physics-of-Failure. 54th Annual Reliability and Maintainability Symposium (RAMS).
Hayatee, F. G. (1975). Heat Dissipation and Ripple Current rating in Electrolytic Capacitors. Electrocomponent Science and Technology, 2, 109-114.
Ikonopisov, S. (1977). Theory of electrical breakdown during formation of barrier anodic films. Electrochimica Acta, ,Volume 22, Issue 10, 1077 - 1082.
Imam, A., Habetler, T., Harley, R., & Divan, D. (2005, June). Condition Monitoring of Electrolytic Capacitor in Power Electronic Circuits using Adaptive Filter Modeling. IEEE 36th Power Electronics Specialists Conference, 2005. PESC ’05., 601-607.
Kulkarni, C., Biswas, G., Celaya, J., & Goebel, K. (2011a). A Case Study for Capacitor Prognostics under Accelerated Degradation. IEEE 2011 Workshop on Accelerated Stress Testing & Reliability (ASTR), September 28-30, San Francisco, CA.
Kulkarni, C., Biswas, G., Celaya, J., & Goebel, K. (2011b). Prognostic Techniques for Capacitor Degradation and Health Monitoring. The Maintenance& Reliability Conference, MARCON 2011, Knoxville, TN.
Kulkarni, C., Biswas, G., & Koutsoukos, X. (2009). A prognosis case study for electrolytic capacitor degradation in DC-DC converters. Proceedings of Annual Conference of the PHM Society, September 27 October 1, San Diego, CA.
Kulkarni, C., Celaya, J., Biswas, G., & Goebel, K. (2011). Prognostic Modeling and Experimental Techniques for Electrolytic Capacitor Health Monitoring. The 8th International Workshop on Structural Health Monitoring 2011 (IWSHM) , September 13-15, Stanford University, Stanford, CA.
Kulkarni, C., Celaya, J., Biswas, G., & Goebel, K. (2012). Prognostic and Experimental Techniques for Electrolytic Capacitor Health Monitoring. The Annual Reliability and Maintainability Symposium (RAMS), January 23-36, Reno, Nevada.
Lahyani, A., Venet, P., Grellet, G., & Viverge, P. (1998, Nov). Failure prediction of electrolytic capacitors during operation of a switchmode power supply. IEEE Transactions on Power Electronics, 13, 1199-1207.
Nie, L., Azarian, M., Keimasi, M., & Pecht, M. (2007). Prognostics of ceramic capacitor temperature humidity bias reliability using mahalanobis distance. Circuit World, 33(3), 21 - 28.
Orsagh, R., & et’al. (2006, March). Prognostic Health Management for Avionics System Power Supplies. Aerospace Conference, 2006 IEEE, 1-7.
Roederstein, V. (2007). Aluminum Capacitors - General Information. Document - 25001 January 2007.
Rusdi, M., Moroi, Y., Nakahara, H., & Shibata, O. (2005). Evaporation from Water Ethylene Glycol Liquid Mixture. Langmuir - American Chemical Society, 21 (16), 7308 - 7310.
Saha, B., Celaya, J. R., Wysocki, P. F., & Goebel, K. F. (2009). Towards prognostics for electronics components. In IEEE Aerospace conference 2009 (p. 1-7). Big Sky, MT.
Saxena, A., Celaya, J., Balaban, E., Goebel, K., Saha, B., Saha, S., et al. (2008). Metrics for evaluating performance of prognostic techniques. In International Conference on Prognostics and Health Management 2008.
Vohnout, S., Kozak, M., Goodman, D., Harris, K., & Judkins, J. (2008). Electronic Prognostics System Implementation on Power Actuator Components. Aerospace Conference, 2008 IEEE, 1 - 11.
Wereszczak, A., Breder, K., & Ferber, M. K. (1998). Failure Probability Prediction of Dielectric Ceramics in Multilayer Capacitors. Annual Meeting of the American Ceramic Society, Cincinnati, OH (United States).
Wit, H. D., & Crevecoeur, C. (1974). The dielectric breakdown of anodic aluminum oxide. Physics Letters A, Volume 50, Issue 5, 365 - 366.
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