Prognostics Method for Analog Electronic Circuits



Arvind Sai Sarathi Vasan Bing Long Michael Pecht


Analog electronic circuits are an integral part of many industrial systems. Failure in such analog circuits during field operation can have severe economic implications. The presence of an expert system that can provide advance warnings on circuit failures can minimize the downtime and improve the reliability of electrical systems. Through successive refinement of circuit’s response to a sweep signal, features are extracted for fault prognosis. From the extracted features, a fault indicator is developed. An empirical model is developed based on the degradation trend exhibited by the fault indicator. Particle filtering approach is used for model adaptation and remaining useful performance estimation. This framework is completely automated and has the merit of implementation simplicity. The proposed framework is demonstrated on two analog filter circuits.

How to Cite

Sai Sarathi Vasan, A. ., Long, B. ., & Pecht, . M. (2012). Prognostics Method for Analog Electronic Circuits. Annual Conference of the PHM Society, 4(1).
Abstract 38 | PDF Downloads 37



Analog circuits, prognostic method

Aminian, F., & Aminian, M. (2002). Analog fault diagnosis of analog circuits using neural networks. IEEE Trans. Instrum. Meas., vol. 51, no. 3, pp. 544-550.

Brown, D., Kalgren, P., Byington, C., & Roemer, M. (2007) Electronic prognostics – a case study using global positioning system (GPS). Microelectron. Reliab., vol. 47, pp. 1874-1881.

Chen, Y-M., Wu, H-C., Chou, M-W., & Lee, K-Y. (2008). Online failure prediction of electrolytic capacitors for LC filter of switching-mode power converters. IEEE Trans. Ind. Electron., vol. 55, no. 1, pp. 400-406.

Kwon, D., Azarian, M., & Pecht, M. (2010). Prognostics of interconnect degradation using RF impedance monitoring and sequential probability ratio test. International Journal of Performability Engineering, vol. 6, no. 5, pp. 443-452.

Orchard, M. & Vachtsevanos, G. (2009). A particle-filtering approach for on-line fault diagnosis. Trans. Inst. Meas. Control, vol. 31, no., pp. 221-246.

Patil, N., Celaya, J., Das, D., Goebel, K., & Pecht, M. (2009). Precursor parameter identification for insulated gate bipolar transistor prognostics. IEEE Trans. Reliab., vol. 58, no. 2, pp. 271-276.

Pecht, M. & Jaai, R. (2010). A prognostics and health management roadmap for information and electronics- rich systems. Microelectron. Reliab., vol. 50, no. 3, pp. 317-323.

Soylemezoglu, A., Jagnnathan, S., & Saygin, C. (2010). Mahalanobis Taguchi system as a prognostic tool for rolling element bearing failures. J. Manuf. Sci. Eng., vol. 132, no. 5, pp. 051014-1-051014-12.

Taguchi, G. & Jugulum, R. (2002) The Mahalanobis- Taguchi strategy. Wiley-Interscience, New York.

Wagner, K. & Williams, T. (1989). Design for testability of analog/digital networks. IEEE Trans. Ind. Electron., vol. 36, no. 2, pp. 227-230.

Xiao, Y. & He, Y. (2011). A novel approach for analog fault diagnosis based on neural networks and improved kernel PCA. Neurocomputing, vol. 74, pp. 1102-1115.
Technical Papers