A Bayesian approach to reliability prediction for one-shot devices
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Published
Jul 14, 2017
Chinuk Lee
Byeongmin Mun
Junseop Lee
Zaeill Kim
Byungtae Ryu
Sukjoo Bae
Abstract
Projectile such as rocket and missiles is one of most important object for military and space industry. In order to measure its reliability accurately, general method which uses binomial distribution often require more than 3,000 sample to evaluate the reliability which can be problematic for further research and development. There have been many researches and studies to predict reliability with small sample size. Many studies suggest Bayesian approach with precise prior distribution as effective method to measure reliability of one shot device. In this research, we suggest application of proportional hazard model with Bayesian approach to estimate reliability of one shot device with
small sample size.
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Keywords
PHM
References
Alexandre C. Mendes. (2014), Proportional hazard model applications in reliability, Northeastern University
Man Ho Ling, B. sc. & M Phil. (2012), Inference for oneshot device testing data. , McMaster University
Narayananswamy Balakrishnan & Man Ho Ling . (2013), Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress, IEEE TRANSACTIONS ON RELIABILITY, 62(2), pp 537-551, DOI: 10.1109/TR.2013.2257054
Narayananswamy Balakrishnan & Man Ho Ling . Gamma lifetimes and one-shot device testing analysis, Reliability Engineering & System Safety,126, pp54-64, DOI: https://doi.org/10.1016/j.ress.2014.01.009
Man Ho Ling, Hon Yiu So & Narayananswamy Balakrishnan. (2016), Likelihood Inference under Proportional hazard model for one-shot device testing. IEEE transactions on reliability, 65(1), pp 446-458, DOI: 10.1016/j.patcog.2003.06.005
Nelson. (1990), Accelerated Testing, Statistical models, Test plans and Data analysis, John Wiley &Sons, New York
S. Bobrowski, M. Doring, U. Jensen & W. Schinkothe. (2011). Reliability prediction using the cox proportional hazards model, 56th International scientific colloquium, Ilmenau university of technology
Tsai-Hung Fan, N. Balakrishnam & Chi-Chen Chang. (2009), The Bayesian approach for high reliable electro-explosive devices using one shot device testing, Journal of Statistical Computation and Simulation, 79(9), pp1143-1154, DOI: 10.1080/00949650802142592
Man Ho Ling, B. sc. & M Phil. (2012), Inference for oneshot device testing data. , McMaster University
Narayananswamy Balakrishnan & Man Ho Ling . (2013), Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress, IEEE TRANSACTIONS ON RELIABILITY, 62(2), pp 537-551, DOI: 10.1109/TR.2013.2257054
Narayananswamy Balakrishnan & Man Ho Ling . Gamma lifetimes and one-shot device testing analysis, Reliability Engineering & System Safety,126, pp54-64, DOI: https://doi.org/10.1016/j.ress.2014.01.009
Man Ho Ling, Hon Yiu So & Narayananswamy Balakrishnan. (2016), Likelihood Inference under Proportional hazard model for one-shot device testing. IEEE transactions on reliability, 65(1), pp 446-458, DOI: 10.1016/j.patcog.2003.06.005
Nelson. (1990), Accelerated Testing, Statistical models, Test plans and Data analysis, John Wiley &Sons, New York
S. Bobrowski, M. Doring, U. Jensen & W. Schinkothe. (2011). Reliability prediction using the cox proportional hazards model, 56th International scientific colloquium, Ilmenau university of technology
Tsai-Hung Fan, N. Balakrishnam & Chi-Chen Chang. (2009), The Bayesian approach for high reliable electro-explosive devices using one shot device testing, Journal of Statistical Computation and Simulation, 79(9), pp1143-1154, DOI: 10.1080/00949650802142592
Section
Regular Session Papers